DMC to Exhibit at NIWeek 2015

Vision Inspection

07/21/2015

0 Comments

NIWeek 2015 is right around the corner and DMC is excited to be attending and exhibiting this year. Over 3,200 innovators from a wide spectrum of industries will gather in Austin, TX on August 3 - 6 for NIWeek. National Instruments' 21st annual conference will present the latest technology for software-defined systems in test, measurement, and control.

NIWeek is always an exciting few days of learning, exposure to new technologies, and connecting with industry peers. This year, DMC will be represented by several employees from across our network of office locations in Chicago, Boston, Denver, Houston, and New York. If you're attending NIWeek look out for the following DMC representatives and stop by DMC's booth 533 to say hello!

	Ken Brey, Technical Director DMC Office: Chicago, IL Bio: Ken is a licensed Professional Engineer in Illinois as well as AIA Certified Vision Professional. He was nominated for Test Engineer of the Year by Test & Measurement World. Ask Me About: 3D vision techniques that are available and vision FPGA. Best Part About Working in Chicago: The variety of industries and diversity of clientele is unmatched elsewhere in the country. Chicago has some of everything. Read Ken's Employee Spotlight interview.
	Jon Carson, Project Director DMC Office: New York, NY Bio: Jon is a licensed Professional Engineer in Illinois. He is experienced with Allen Bradley and Siemens PLCs as well as ELAU motion controllers.Among his certifications are Microsoft Certified Solutions Developer C# and German Technical Translation. Ask Me About: Developing a new end-of-line test station for an automotive sensor manufacturing line using LabVIEW. Best Part About Working in NYC: Living near my family and being a five minute walk from anything I want to do. Read Jon's Employee Spotlight interview.
	Katherine Czaplicki, Systems Engineer DMC Office: Chicago, IL Bio: Katherine is a Certified LabVIEW Developer who has been working in LabVIEW since her first day at DMC. She is excited to be returning to her home state of Texas for NIWeek. Ask Me About: Automated vision inspection systems. Best Part About Working in Chicago: Attending the festivals that are held all summer.
	Dan Freve, Project Director DMC Office: Boston, MA Bio: A Massachusetts native, Dan is the lead of DMC's Boston office. He became a Certified LabVIEW Developer in 2008 and is highly experienced with MATLAB. Ask Me About: Programming DMC's Tilt Table Demo using an NI cRIO with integrated FPGA running in LabVIEW. Best Part About Working in Boston: Spending time sailing in the Boston Harbor. Watch Dan's Employee Spotlight video.
	Otto Gottlieb, Project Engineer DMC Office:Denver, CO Bio: Otto used to develop testing applications for medical devices. He's experienced in a broad mix of programming including Siemens PLCs, Allen-Bradley PLCs, and .NET applications. Ask Me About: End-of-Line testing applications. Best Part About Working in Denver: I get to ski all winter and hike all summer! Watch Otto's Employee Spotlight video.
	Darren Jones, Project Director DMC Office:Chicago, IL Bio: Darren is a Certified Professional Instructor and Certified LabVIEW Architect. He is DMC's go-to person for all things National Instruments-related. Ask Me About: Designing DMC's myRIO-based solar powered garden system. Best Part About Working in Chicago: Enjoying the skyline from our rooftop deck! Read Darren's Employee Spotlight interview.
	Jason Mayes, Project Director DMC Office:Houston, TX Bio: Jason recently returned to his home state of Texas to lead the DMC Houston office. He earned his B.S., M.S., and Ph.D. from the University of Notre Dame. Jason is a Certified LabVIEW Developer and has experience in C++, C#, Siemens, Allen-Bradley, and a host of other platforms. Ask Me About: Vision. I used vision feedback to close the loop on a 3D electron beam welder for the rapid prototyping of titanium parts. Best Part About Working in Houston: BBQ, TexMex, and the Houston Rodeo. Watch Jason's Employee Spotlight video.