Prologue In May 2019, at what would become the last NI Week ever, I led a session called “Learning to Love Text Again With Measurement Studio.” It was scheduled for 8:30 AM on the last day of the conference, so I was surprised that so ...
DMC joined National Instruments (NI) at The Battery Show this past September and showcased some of the battery testing solutions we offer. Three of our engineers attended the conference – Jesse Batsche, Senior Director of Test &...
DMC is excited to attend The Battery Show this year, and to join National Instruments (NI) in demonstrating our latest battery testing solutions. The conference will be held at the Suburban Collection Showplace in Novi, Michigan on Septembe...
Last month, several members of DMC’s Test and Measurement team attended NI Connect, an annual conference hosted by National Instruments. This conference features technical presentations, new product announcements, and networking event...
Adding the ability for a user to Enable and Disable a Custom Device in the System Definition Editor allows the user to save time when troubleshooting large and complex system definition files. It can be extremely inefficient and painful to conti...
Adding logic to upgrade NI VeriStand Custom Device versions allows the functionality of a Custom Device to be modified without having to delete and re-add a Custom Device in a System Definition File. This can save a developer time and frustration whe...
The NI VeriStand Custom Device Wizard is a powerful open-source tool to generate various Template Custom Devices. This tool saves time by implementing several features that are desired for all Custom Devices. This blog details how to install the NI V...
The annual NIWeek conference is a favorite event for members of DMC's Test and Measurement team. Typically, team members join the conference in Austin for a few days of technical presentation, demos, announcements, and tacos. This year, ...
DMC is proud to announce that two of our engineers are recognized as Certified TestStand Architects by NI. Congratulations to Cecilia Brookshier and Steven Dusing for displaying expertise in architecting test system...